Spectrometer X-ray fluorescent highly sensitive SRV-1N
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Technical characteristics
- Country of manufactureKazakhstan
Description
The X-ray fluorescent spectrometer of modification of "SRV-1N" is intended for express high-quality and quantitative determination of the content (mass fractions) of chemical elements in strong, liquid and powdery objects of a natural and artificial origin.
X-ray fluorescent spectrometer of modification of "SRV-1N" represent the wearable functionally complete measuring and accumulative complex with autonomous food placed in a case and it is intended for work in field and laboratory conditions. Operation of a spectrometer in stationary option is possible.
The spectrometer of the SRV-1N model is in addition supplied with the autonomous supply unit and the network adapter for work from an external network of power supply.
In the SRV-1N model as the personal computer Notebook is used.
Main analytical and technical characteristics of a spectrometer of modification of "SRV-1N"
| Range of the analyzed elements: | from Ca to U |
| Range of the analyzed power range: |
2 — 30 kev |
| Analysis method: | X-ray fluorescent power dispersive |
| Power permission of semiconductor the detector on the line 5,9 kev (depending on detector type): |
150 — 180 ev |
| Time of the quantitative analysis of the 1st test: | 1 — 15 min. |
| Own instrument error: | no more than 1% |
| Types of the possible analyzed samples: | liquid, firm, powders, filters, films |
| Quantity of at the same time defined elements: |
10 |
| Power consumption: | no more than 70 W |
| Overall dimensions: | no more 450×150×350 mm |
| Mass of a spectrometer: | no more than 15 kg |
Complete set of a spectrometer of the SRV-1N model:
| — main module of a spectrometer; — personal Notebook computer; — laser printer; — the network adapter for the stationary mode; — independent power supply; — software set; — accessories and accessories to preparation of radiators; — package of technical documentation; — copies of the certificate on a spectrometer as a gage; — the approved checking technique; — act of primary radiation inspection. |
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Spectrometer X-ray fluorescent highly sensitive SRV-1N
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